Publication detail

Methods for Integrated Capacitors Characterization

SUTORÝ, T.

Original Title

Methods for Integrated Capacitors Characterization

Type

conference paper

Language

English

Original Abstract

This paper deals with techniques for capacitance characterization of integrated capacitors on a chip. Several methods are compared and a new method for non-linear capacitor characterization is proposed. It can measure the whole nonlinear characteristic in both polarities without necessity to switch the measured object.

Key words in English

capacitance characterization, integrated capacitors, non-linear capacitor

Authors

SUTORÝ, T.

RIV year

2005

Released

3. 5. 2005

Publisher

The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic

Location

Brno

ISBN

80-214-2904-6

Book

Proceedings of the15th International Czech - Slovak Scientific Conference RADIOELEKTRONIKA 2005

Pages from

452

Pages to

455

Pages count

4

BibTex

@inproceedings{BUT14757,
  author="Tomáš {Sutorý}",
  title="Methods for Integrated Capacitors Characterization",
  booktitle="Proceedings of the15th International Czech - Slovak Scientific Conference RADIOELEKTRONIKA 2005",
  year="2005",
  pages="4",
  publisher="The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic",
  address="Brno",
  isbn="80-214-2904-6"
}