Šumová spektroskopie pro rychlé nedestruktivní testování kvality, spolehlivosti a životnosti solárních článků

Description in English
Noise spectroscopy for fast non-destructive testing of solar cells quality, reliability and service lifetime

GA102/04/0142

Czech

Chobola Zdeněk, prof. RNDr., CSc. - principal person responsible

Institute of Physics
- responsible department (5.2.2004 - not assigned)
Institute of Physics
- beneficiary (5.2.2004 - not assigned)

VANĚK, J., KAZELLE, J., BRZOKOUPIL, V., VAŠÍČEK, T., CHOBOLA, Z., BAŘINKA, R. The Comparison of LBIC Method with Noise Spectroscopy. Photovoltaic Devices. Kranjska Gora, Slovenia: PV-NET, 2004. p. 60 ( p.)
Detail

SCHAUER, P. Noise spectroscopy of shallow traps in CdTe crystals. ElectroScope - http://www.electroscope.zcu.cz, 2010, vol. 2010, no. 3, p. 55-59. ISSN: 1802-4564.
Detail

CHOBOLA, Z., JURÁNKOVÁ, V., VANĚK, J. Noise spectroscopy measurement of 2.3 microm CW GaSb based laser diodes. Elektronika, 2005, vol. 2005, no. 1, p. 70 ( p.)ISSN: 0033-2089.
Detail

CHOBOLA, Z.; HASSE, L.; SPIRALSKI, L. 1/f noise as a diagnostic tool for non-destructive testing of silicon solar cells. Elektronika, 2006, vol. 2006, no. 1, p. 48-49. ISSN: 0033-2089.
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VANĚK, J.; CHOBOLA, Z.; HASSE, L. Effect of illumination on noise of silicon solar cell. Elektronika, 2004, vol. 2004, no. 5, p. 16 ( p.)ISSN: 0033-2089.
Detail

VANĚK, J.; CHOBOLA, Z.; HASSE, L. Effect of illumination on noise of silicon solar cells. Elektronika, 2004, roč. 5, č. 5, s. 16 ( s.)ISSN: 0033-2089.
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CHOBOLA, Z.; HASSE, L.; ŠIKULA, J.; SPIRALSKI, L. Noise Spectroscopy of Semiconductor Parth II. Elektronika, 2004, vol. 2, no. 2, p. 7 ( p.)ISSN: 0033-2089.
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CHOBOLA, Z., IBRAHIM, A. Noise and scanning by local illumination as Reliability estimation for silicon solar cells. Fluctuation and Noise Letters, 2001, vol. 1, no. 1, p. L21 ( p.)ISSN: 0219-4775.
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CHOBOLA, Z. Noise as a tool for non-destructive testing of single-crystal silicon solar cells. Microelectronics Reliability, 2001, vol. 41/12, p. 1947 ( p.)ISSN: 0026-2714.
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CHOBOLA, Z. Impulse noise in silicon solar cells. Microelectronics Journal, 2001, vol. 32/9, p. 707 ( p.)ISSN: 0026-2692.
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CHOBOLA, Z. Noise as a tool for non-destructive testing of signle-crystal silicon solar cells. Microelectronics Journal, 2001, vol. 2001, no. 8, p. 1947 ( p.)ISSN: 0026-2692.
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SKALA, J.; CHOBOLA, Z. Optimalizace využití metody impact-echo jako nástroje pro posouzení stavu koroze železobetonových dílců. In Proc. of the Workshop NDT 2006. Brno: Brno University of Technology, 2006. s. 144-146. ISBN: 80-7204-487-7.
Detail

HRUŠKA, P.; CHOBOLA, Z. Diagnostics of silicon solar cell of type G3 with bifacial alkali texture. In Proc. of the Workshop NDT 2006. Brno: Brno University of Technology, 2006. p. 46-48. ISBN: 978-80-7204-487-7.
Detail

HRUŠKA, P.; CHOBOLA, Z. Diagnostics of silicon solar cell of type G5 with bifacial acidic texture. In Proc. of the Workshop NDT 2006. Brno: Brno University of Technology, 2006. p. 43-45. ISBN: 978-80-7204-487-7.
Detail

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V. Passivation quality test by noise method. In Electronic Devices and Systems. Brno: Ing.Zdeněk Novotný,CSc., 2006. p. 175-178. ISBN: 80-214-3246-2.
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VANĚK, J.; CHOBOLA, Z.; KAZELLE, J. Noise spectroscopy used in Si:H amorphous solar cells diagnostic. In Proc. of the International Conference held in Dresden, Germany. Dresden, Germany: WIP-Renewable Energies, 2006. p. 1620-1622. ISBN: 3-936338-20-5.
Detail

VANĚK, J., KAZELLE, J., CHOBOLA, Z., JURÁNKOVÁ, V. Passivation quality test by noise method. In EDS06. Brno: VUT v Brně, 2006. p. 175 ( p.)ISBN: 80-214-3246-2.
Detail

LUŇÁK, M. Určení obrazu funkce hustoty stavů dekonvolucí spektra koeficientu absorpce na struktuře a-Si:H. In Workshop NDT 2006 Non-Destructive Testing in Engineering Practice. Brno: 2006. s. 98-103. ISBN: 80-7204-487-7.
Detail

VANĚK, J., CHOBOLA, Z., KAZELLE, J. Noise Spectroscopy Used in Si:H Amorphous Solar Cells Diagnostic. In Proceeding of 21st European Photovoltaic Solar Energy Conference. Dresden, Germany: WIP-Renewable Energies, 2006. p. 1620 ( p.)ISBN: 3-936338-20-5.
Detail

KOKTAVÝ, P.; KOKTAVÝ, B. Využití šumu mikroplazmy pro diagnostiku solárních článků. In Workshop NDT 2006, Non-destructive Testing in Engineering Practise. Brno: Brno University of Technology, 2006. s. 63-66. ISBN: 80-7204-487-7.
Detail

Responsibility: Chobola Zdeněk, prof. RNDr., CSc.