Project detail

Identity falsification of base stations in Open RAN context: Cybersecurity of 5G networks based on physical layer parameters

Duration: 01.01.2023 — 31.12.2025

Funding resources

Ministerstvo vnitra ČR - 1 VS OPSEC

- whole funder

On the project

Description in English
Accesible software and hardware resources will allow for the rapid development and diversification of 5G networks. On the other hand, they can pose significant security risks. One of the risks identified in the Report on the cybersecurity of Open RAN, released by the NIS Cooperation Group in May 2022, is the use of 5G networks within organized crime. One of the technical means of such misuse can be, for example, identity of 5G base stations, where an attacker gains complete access to the operation of part of the network and user data. The aim of the project is to propose appropriate measures and verify the real possibility of their use to provide additional security against stoling the identity of 5G base stations, both closed networks, but especially of Open RAN networks.

Key words in English
mobile network cybersecurity, identity falsification

Mark

VK01030166

Default language

Czech

People responsible

Blumenstein Jiří, doc. Ing., Ph.D. - fellow researcher
Bolcek Jan, Ing. - fellow researcher
Hanus Stanislav, prof. Ing., CSc. - fellow researcher
Harvánek Michal, Ing., Ph.D. - fellow researcher
Kufa Jan, Ing., Ph.D. - fellow researcher
Maršálek Roman, prof. Ing., Ph.D. - fellow researcher
Šimka Marek, Ing. - fellow researcher
Urbanec Tomáš, Ing., Ph.D. - fellow researcher
Vychodil Josef, Ing., Ph.D. - fellow researcher
Polák Ladislav, doc. Ing., Ph.D. - principal person responsible

Units

Department of Radio Electronics
- beneficiary (2022-05-26 - not assigned)

Results

BOLCEK, J.; KUFA, J.; HARVÁNEK, M.; POLÁK, L.; KRÁL, J.; MARŠÁLEK, R. Deep Learning-Based Radio Frequency Identification of False Base Stations. In 2023 Workshop on Microwave Theory and Technology in Wireless Communications (MTTW). Riga, Latvia: IEEE, 2023. p. 45-49. ISBN: 979-8-3503-9349-1.
Detail