Project detail

Noise spectroscopy for quality and reliability asessment of thick film resistors

Duration: 01.01.2001 — 31.12.2001

Funding resources

Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- whole funder

On the project

Stanovení kvality a spolehlivosti tlustovrstvových rezistorů na základě experimentálního studia frekvenční závislosti šumové spektrální hustoty. Prognóza kvality a spolehlivosti založená na hodnotý šumové spektrální hustoty a nelinearity. Nelinearita volt-ampérové charakteristiky je hodnocena indexem třetí harmonicky přesný sinusového signálu o frekvenci 10 kHz. Vysoce spolehlivé tlustovrstvové odpory jsou projektovány pro aplikace v hybridních obvodech telekomunikací, medicíny a průmyslu

Description in English
The project is oriented on quality and reliability prognosis for thick film resistors. This method is based on fluctuation phenomena and non-linearity of charge carrier transport. Defects and technology irregularities are detected by noise spectral density in low frequency range. Quality of contacts and sample homogeneity is tested by third harmonic index at the frequency 10 kHz. High reliability thick film resistors are designed for hybrid circuits application in telecommunication, medicine and industry.

Mark

ME 244

Default language

Czech

People responsible

Grmela Lubomír, prof. Ing., CSc. - fellow researcher
Pavelka Jan, doc. Mgr., CSc. Ph.D. - fellow researcher
Šikula Josef, prof. Ing. RNDr., DrSc. - principal person responsible

Units

Faculty of Civil Engineering
- responsible department (1989-01-01 - not assigned)

Results

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 111 ( p.)ISBN: 80-214-143.
Detail

SADOVSKÝ, P., BARTUŠEK, K. Optimisation of the Transient Response of a Digital Filter. Radioengineering, 2000, vol. 9, no. 2, p. 14 ( p.)ISSN: 1210-2512.
Detail

ŠIKULA, J. Chybí název. In CARTS 99. Huntsville, USA: Components Technology Institute, Inc., 1999. p. 292 ( p.)ISBN: 80-01-0195.
Detail

ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 150 ( p.)ISBN: 1-874612-2.
Detail

GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film electroluminescent lamp. In Electronics Devices and System. Brno: Vysoké učení technické v Brně, 2001. p. 44 ( p.)ISBN: 80-214-1960-1.
Detail

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 171 ( p.)ISBN: 0887-7491.
Detail

SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 245 ( p.)ISBN: 961-91023-0-4.
Detail

SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th Conference STUDENT EEICT 2002. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 244 ( p.)ISBN: 80-214-2115-0.
Detail

SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK-FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. p. 320 ( p.)ISBN: 83-904462-8-6.
Detail

SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th ECNDT. Leganes, Madrid: Spanish Society for NDT AEND, 2002. p. 215 ( p.)ISBN: 84-699-8573-6.
Detail

SEDLÁKOVÁ, V. Noise Spectroscopy of Thick Film Resistors. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 117 ( p.)ISBN: 80-214-1992-X.
Detail

SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 747 ( p.)ISBN: 981-02-4677-3.
Detail

ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Low Frequency Noise of Thick Conducting Films. In Proc. of 15th Int. Conf. on Noise in Physical Systems and 1/f Fluctuations ICNF, Hong Kong August 1999, ed. C. Surya. Hong Kong: Bentham Press, 1999. p. 154-157. ISBN: 1-874612-28-5.
Detail

ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator. Microelectronics Reliability, 2002, vol. 41, no. 4, p. 531-542. ISSN: 0026-2714.
Detail

ŠIKULA, J. Chybí název. In CARTS-EUROPE 99. East Sussex,England: ECII Ltd., 1999. p. 163 ( p.)ISBN: 80-01-0195.
Detail

Responsibility: Šikula Josef, prof. Ing. RNDr., DrSc.