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POSPÍŠIL, M. MARŠÁLEK, R. POMĚNKOVÁ, J.
Original Title
Wireless device authentication through transmitter imperfections - measurement and classification
Type
conference paper
Language
English
Original Abstract
This paper is oriented in the area of wireless device identification through the analysis of emitted signals corrupted by radio frequency transmitter impairments. These impairments (such as power amplifier nonlinearity, IQ modulator imbalance, DC offset, phase noise, carrier frequency offset, shaping filter length and its shape) represent a unique characterization of any radio wireless transmitting device. We have performed a set of measurements on a sample of nine different transmitters (three baseboards plus three different front-ends) based on USRP software defined radio family in order to verify the potential of real applications of this authentication principle. After performing measurements in ideal conditions, we further proceeded in simulating a simple classifier based on gaussian mixture models and we briefly evaluated its performance in a real situation of a radio transmitting through air to the vector signal analyzer serving as the receiver. We also analyzed the influence of number of measurements on the classifier performance.
Keywords
transmitter imperfections, gaussian mixture models, USRP, vector signal analysis
Authors
POSPÍŠIL, M.; MARŠÁLEK, R.; POMĚNKOVÁ, J.
RIV year
2013
Released
8. 9. 2013
Publisher
IEEE
Location
New York, USA
ISBN
978-1-4577-1348-4
Book
Proceedings of 2013 IEEE 24th International symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
Pages from
497
Pages to
501
Pages count
5
URL
https://ieeexplore.ieee.org/document/6666187
BibTex
@inproceedings{BUT100875, author="Martin {Pospíšil} and Roman {Maršálek} and Jitka {Poměnková}", title="Wireless device authentication through transmitter imperfections - measurement and classification", booktitle="Proceedings of 2013 IEEE 24th International symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)", year="2013", pages="497--501", publisher="IEEE", address="New York, USA", doi="10.1109/PIMRC.2013.6666187", isbn="978-1-4577-1348-4", url="https://ieeexplore.ieee.org/document/6666187" }