Publication detail

Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells

ŠICNER, J. MACKŮ, R. KOKTAVÝ, P. HOLCMAN, V.

Original Title

Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells

Type

conference paper

Language

English

Original Abstract

Paper deals with diagnostics of crystalline silicon solar cells with structures prepared by application of laser technologies. These laser-generated structures should help to isolate the edges of solar cells and also should isolate bulk defects. At the present we are trying to find the optimal parameters of laser processing. Laser parameters influencing how deep the laser notch is realized. We tried to determine what depth of the notch seems to be an ideal. Noise diagnostic methods are used for our study. These methods are based on the study of electrically measurable fluctuation quantities, especially electrical voltage and current, complemented by the transport characteristics. Electrical models describing behaviour of laser-prepared structures were put forward. The study of optical near-field and far-field will be also realized. Measurement of local radiation from solar cells during electrical excitation were carried out.

Keywords

solar cell; laser notches; noise; defects

Key words in English

solar cell; laser notches; noise; defects

Authors

ŠICNER, J.; MACKŮ, R.; KOKTAVÝ, P.; HOLCMAN, V.

RIV year

2013

Released

28. 6. 2013

Location

Montpellier

ISBN

978-1-4799-0670-3

Book

2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB

Pages from

1

Pages to

4

Pages count

4

BibTex

@inproceedings{BUT101555,
  author="Jiří {Šicner} and Robert {Macků} and Pavel {Koktavý} and Vladimír {Holcman}",
  title="Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells",
  booktitle="2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB",
  year="2013",
  pages="1--4",
  address="Montpellier",
  isbn="978-1-4799-0670-3"
}