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ŠKARVADA, P. TOMÁNEK, P. ŠICNER, J.
Original Title
Influence of localized structure defects on the pn junction properties
Type
conference proceedings
Language
English
Original Abstract
Local defects in the solar cell structures evidently affect electrical and photoelectrical properties of the cells. These local defects can be microfractures, precipitates and other material structure inhomogeneities. Localization of the defects in the structure and assigning particular defects with photoelectrical parameter deterioration is keypoint for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization on the sample has to been done by microscopic investigations and defects light emission measurement under electrical bias conditions. The defects structures are microscopically investigated in this paper. Moreover the experimental results obtained from samples where the defects were removed by focused ion beam are presented. Sample electrical and photoelectrical properties before and after milling are discussed.
Keywords
Solar cell, defect, silicon, ion beam milling
Authors
ŠKARVADA, P.; TOMÁNEK, P.; ŠICNER, J.
Released
1. 7. 2013
Publisher
VUTIUM
Location
Brno
ISBN
978-80-214-4739-4
Pages from
203
Pages to
Pages count
1
BibTex
@proceedings{BUT101623, editor="Pavel {Škarvada} and Pavel {Tománek} and Jiří {Šicner}", title="Influence of localized structure defects on the pn junction properties", year="2013", pages="203--203", publisher="VUTIUM", address="Brno", isbn="978-80-214-4739-4" }