Publication detail

Influence of localized structure defects on the pn junction properties

ŠKARVADA, P. TOMÁNEK, P. ŠICNER, J.

Original Title

Influence of localized structure defects on the pn junction properties

Type

conference proceedings

Language

English

Original Abstract

Local defects in the solar cell structures evidently affect electrical and photoelectrical properties of the cells. These local defects can be microfractures, precipitates and other material structure inhomogeneities. Localization of the defects in the structure and assigning particular defects with photoelectrical parameter deterioration is keypoint for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization on the sample has to been done by microscopic investigations and defects light emission measurement under electrical bias conditions. The defects structures are microscopically investigated in this paper. Moreover the experimental results obtained from samples where the defects were removed by focused ion beam are presented. Sample electrical and photoelectrical properties before and after milling are discussed.

Keywords

Solar cell, defect, silicon, ion beam milling

Authors

ŠKARVADA, P.; TOMÁNEK, P.; ŠICNER, J.

Released

1. 7. 2013

Publisher

VUTIUM

Location

Brno

ISBN

978-80-214-4739-4

Pages from

203

Pages to

203

Pages count

1

BibTex

@proceedings{BUT101623,
  editor="Pavel {Škarvada} and Pavel {Tománek} and Jiří {Šicner}",
  title="Influence of localized structure defects on the pn junction properties",
  year="2013",
  pages="203--203",
  publisher="VUTIUM",
  address="Brno",
  isbn="978-80-214-4739-4"
}