Publication detail

Optical and electrical detection and localization of solar cell defects on microscale

ŠKARVADA, P. MACKŮ, R. DALLAEVA, D. PROKOPYEVA, E. TOMÁNEK, P. GRMELA, L. SMITH, S.

Original Title

Optical and electrical detection and localization of solar cell defects on microscale

Type

journal article - other

Language

English

Original Abstract

Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations as well as by defects light emission measurement under electrical bias conditions. The experimental results obtained from samples where the defects were microscopically repaired by focused ion beam are presented. Electrical and photoelectrical properties of sample before and after milling processing are also discussed.

Keywords

solar cell, silicon, monocrystalline, defect, localization, detection, efficiency

Authors

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; PROKOPYEVA, E.; TOMÁNEK, P.; GRMELA, L.; SMITH, S.

RIV year

2013

Released

24. 9. 2013

Publisher

SPIE

Location

Bellingham USA

ISBN

0277-786X

Periodical

Proceedings of SPIE

Year of study

8825

Number

8825

State

United States of America

Pages from

8825071

Pages to

88255077

Pages count

8

BibTex

@article{BUT101902,
  author="Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Elena {Prokopyeva} and Pavel {Tománek} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Optical and electrical detection and localization of solar cell defects on microscale",
  journal="Proceedings of SPIE",
  year="2013",
  volume="8825",
  number="8825",
  pages="8825071--88255077",
  doi="10.1117/12.2023265",
  issn="0277-786X"
}