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STOJAN, R. VANĚK, J. MALÝ, M. GVRITISHVILI, R. TOMÁNEK, P. FRANTÍK, O.
Original Title
Luminescence radiation spectroscopy of silicon solar cells
Type
journal article - other
Language
English
Original Abstract
This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells.
Keywords
Solar cells, photoluminescence, electroluminescence, electromagnetic radiation, polarization, defect.
Authors
STOJAN, R.; VANĚK, J.; MALÝ, M.; GVRITISHVILI, R.; TOMÁNEK, P.; FRANTÍK, O.
RIV year
2013
Released
27. 9. 2013
Publisher
SPIE
Location
Bellingham USA
ISBN
0277-786X
Periodical
Proceedings of SPIE
Year of study
8825
Number
State
United States of America
Pages from
882529
Pages to
882535
Pages count
6
BibTex
@article{BUT101917, author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý} and Roman {Gvritishvili} and Pavel {Tománek} and Ondřej {Frantík}", title="Luminescence radiation spectroscopy of silicon solar cells", journal="Proceedings of SPIE", year="2013", volume="8825", number="8825", pages="882529--882535", doi="10.1117/12.2024290", issn="0277-786X" }