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ŠIK, O. TRČKA, T. GRMELA, L. VONDRA, M.
Original Title
Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors
English Title
Type
journal article - other
Language
Czech
Original Abstract
Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing.
English abstract
Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100 C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing.
Keywords
CdTe, Noise, Reliability
Key words in English
CdTe, šum, spolehlivost
Authors
ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M.
RIV year
2013
Released
10. 1. 2013
Publisher
Universal Association of Computer and Electronics Engineers
Location
113 Barksdale Professional CTR, Newark, New Castle County, DE, United States of America
ISBN
2319-7498
Periodical
International Journal of Advancements in Electronics and Electrical Engineering
Year of study
3
Number
1
State
United States of America
Pages from
60
Pages to
63
Pages count
4
BibTex
@article{BUT101977, author="Ondřej {Šik} and Tomáš {Trčka} and Lubomír {Grmela} and Marek {Vondra}", title="Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors", journal="International Journal of Advancements in Electronics and Electrical Engineering", year="2013", volume="3", number="1", pages="60--63", issn="2319-7498" }