Publication detail

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

ZACHARIÁŠOVÁ, M. BOLCHINI, C. KOTÁSEK, Z.

Original Title

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches devoted to verification of hardened systems, with respect to the test set generation: the first one is based on classical Automatic Test Pattern Generation, the second one on Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced few ideas about their combination in order to create a new promising approach for verification of reliable systems.

Keywords

ATPG, funkční verifikace.

Authors

ZACHARIÁŠOVÁ, M.; BOLCHINI, C.; KOTÁSEK, Z.

RIV year

2013

Released

8. 4. 2013

Publisher

IEEE Computer Society

Location

Karlovy Vary

ISBN

978-1-4673-6133-0

Book

IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Pages from

275

Pages to

278

Pages count

4

BibTex

@inproceedings{BUT103467,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  booktitle="IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2013",
  pages="275--278",
  publisher="IEEE Computer Society",
  address="Karlovy Vary",
  isbn="978-1-4673-6133-0"
}