Publication detail

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

ZACHARIÁŠOVÁ, M. BOLCHINI, C. KOTÁSEK, Z.

Original Title

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order
to create a new promising approach for testing reliable systems.

Keywords

ATPG, functional verification.

Authors

ZACHARIÁŠOVÁ, M.; BOLCHINI, C.; KOTÁSEK, Z.

RIV year

2013

Released

21. 6. 2013

Publisher

COST, European Cooperation in Science and Technology

Location

Avignon

ISBN

978-2-11-129175-1

Book

Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale

Pages from

35

Pages to

38

Pages count

4

BibTex

@inproceedings{BUT103529,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  booktitle="Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale",
  year="2013",
  pages="35--38",
  publisher="COST, European Cooperation in Science and Technology",
  address="Avignon",
  isbn="978-2-11-129175-1"
}