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STOJAN, R. VANĚK, J. MALÝ, M.
Original Title
Progression of Silicon Solar Cells Luminescence Diagnostic Methods
Type
journal article - other
Language
English
Original Abstract
Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera with those methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.
Keywords
Silicon defect, luminescence, defect detection.
Authors
STOJAN, R.; VANĚK, J.; MALÝ, M.
RIV year
2014
Released
1. 1. 2014
Publisher
Horizon Research Publishing,USA
Location
USA
ISBN
2332-3299
Periodical
Universal Journal of Electrical and Electronic Engineering
Year of study
2
Number
1
State
United States of America
Pages from
18
Pages to
22
Pages count
5
URL
http://www.hrpub.org/journals/jour_info.php?id=49
BibTex
@article{BUT103820, author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý}", title="Progression of Silicon Solar Cells Luminescence Diagnostic Methods", journal="Universal Journal of Electrical and Electronic Engineering", year="2014", volume="2", number="1", pages="18--22", doi="10.13189/ujeee.2014.020103", issn="2332-3299", url="http://www.hrpub.org/journals/jour_info.php?id=49" }