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PETRÁČKOVÁ, K. NÁHLÍK, L. TRUHLÁŘ, M. KUBĚNA, I. HUTAŘ, P.
Original Title
APPLICATION OF FEM TO ESTIMATE OF MECHANICAL PROPERTIES OF THIN LAYERS
Type
abstract
Language
English
Original Abstract
This paper describes a new method for testing of thin layers, so-called microcompression test. As an example determination of Al thin film properties deposited on Si substrate is introduced in the paper. Experimentally measured data obtained on (micro) pillars need correction to obtain undistorted material properties of Al thin film. A necessary correction using finite element modeling (FEM) is suggested in the paper. The paper contributes to a better characterization of very thin surface layers and determination of their mechanical properties.
Keywords
Microcompresion test, FEM
Authors
PETRÁČKOVÁ, K.; NÁHLÍK, L.; TRUHLÁŘ, M.; KUBĚNA, I.; HUTAŘ, P.
Released
15. 4. 2013
BibTex
@misc{BUT104851, author="Klára {Petráčková} and Luboš {Náhlík} and Michal {Truhlář} and Ivo {Kuběna} and Pavel {Hutař}", title="APPLICATION OF FEM TO ESTIMATE OF MECHANICAL PROPERTIES OF THIN LAYERS", booktitle="15th International Conference, APPLIED MECHANICS 2013", year="2013", note="abstract" }