Publication detail

Study of the Influence of Structural Defects on Properties of Silicon Solar Cells

ŠICNER, J. ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P.

Original Title

Study of the Influence of Structural Defects on Properties of Silicon Solar Cells

Type

journal article in Web of Science

Language

English

Original Abstract

Solar cells of common sizes contains many of these defects and it is not easy to determine the influence of particular defects on the characteristics of the whole solar cell. Therefore, in our research we use samples of size of square centimeter at which we can disentangle the influence of the defect. We localize the defect by using a CCD camera, we measure the electrical, thermal and optical properties of the sample and then study it by means an electron microscope, we find the damaged structure and put it to focused ion beam. We expect the change in electrical, thermal and optical properties of the sample.

Keywords

Focused Ion Beam (FIB), Nondestructive Diagnostics, Solar Cell, Structural Defects

Authors

ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.

RIV year

2014

Released

1. 1. 2014

Publisher

Trans tech publication

Location

Switzerland

ISBN

1013-9826

Periodical

Key Engineering Materials (print)

Year of study

592-593

Number

1

State

Swiss Confederation

Pages from

449

Pages to

452

Pages count

4

BibTex

@article{BUT105398,
  author="Jiří {Šicner} and Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý}",
  title="Study of the Influence of Structural Defects on Properties of Silicon Solar Cells",
  journal="Key Engineering Materials (print)",
  year="2014",
  volume="592-593",
  number="1",
  pages="449--452",
  doi="10.4028/www.scientific.net/KEM.592-593.449",
  issn="1013-9826"
}