Přístupnostní navigace
E-application
Search Search Close
Publication detail
ŠICNER, J. ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P.
Original Title
Study of the Influence of Structural Defects on Properties of Silicon Solar Cells
Type
journal article in Web of Science
Language
English
Original Abstract
Solar cells of common sizes contains many of these defects and it is not easy to determine the influence of particular defects on the characteristics of the whole solar cell. Therefore, in our research we use samples of size of square centimeter at which we can disentangle the influence of the defect. We localize the defect by using a CCD camera, we measure the electrical, thermal and optical properties of the sample and then study it by means an electron microscope, we find the damaged structure and put it to focused ion beam. We expect the change in electrical, thermal and optical properties of the sample.
Keywords
Focused Ion Beam (FIB), Nondestructive Diagnostics, Solar Cell, Structural Defects
Authors
ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.
RIV year
2014
Released
1. 1. 2014
Publisher
Trans tech publication
Location
Switzerland
ISBN
1013-9826
Periodical
Key Engineering Materials (print)
Year of study
592-593
Number
1
State
Swiss Confederation
Pages from
449
Pages to
452
Pages count
4
BibTex
@article{BUT105398, author="Jiří {Šicner} and Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý}", title="Study of the Influence of Structural Defects on Properties of Silicon Solar Cells", journal="Key Engineering Materials (print)", year="2014", volume="592-593", number="1", pages="449--452", doi="10.4028/www.scientific.net/KEM.592-593.449", issn="1013-9826" }