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MACKŮ, R. ŠICNER, J. HOLCMAN, V. KOKTAVÝ, P.
Original Title
Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure
Type
journal article in Scopus
Language
English
Original Abstract
Presented research is involved in excess electrical currents created when the silicon material contains cracks and fractures. We performed transport characteristics measurements and electrical noise measurement as well as sample visible and deep infrared imaging. It turns out that mechanical induced defects are followed by specific electric characteristics. We observe crackrelated local breakdowns and local overheating. It is also followed by the electrical current fluctuation in the 1/f form. All regions are thermally but also electrically stressed and the irreversible sample degradation originates. It could be pointed out that our detection methods are very sensitive and they could be used for analyses of different materials.
Keywords
Solar cell, local defects, fractures, electrical noise, light emission
Authors
MACKŮ, R.; ŠICNER, J.; HOLCMAN, V.; KOKTAVÝ, P.
RIV year
2014
Released
1. 1. 2014
Publisher
Trans tech publication
Location
Switzerland
ISBN
1013-9826
Periodical
Key Engineering Materials (print)
Year of study
592-593
Number
1
State
Swiss Confederation
Pages from
533
Pages to
536
Pages count
4
BibTex
@article{BUT105452, author="Robert {Macků} and Jiří {Šicner} and Vladimír {Holcman} and Pavel {Koktavý}", title="Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure", journal="Key Engineering Materials (print)", year="2014", volume="592-593", number="1", pages="533--536", doi="10.4028/www.scientific.net/KEM.592-593.533", issn="1013-9826" }