Publication detail

Independent analysis of mechanical data from atomic force microscopy

KLAPETEK, P. NEČAS, D.

Original Title

Independent analysis of mechanical data from atomic force microscopy

Type

journal article in Web of Science

Language

English

Original Abstract

Present atomic force microscopes are capable of acquiring large data volumes by point using point force–distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force–distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy.

Keywords

atomic force microscopy;mechanical properties;force-distance curve;uncertainties

Authors

KLAPETEK, P.; NEČAS, D.

RIV year

2014

Released

5. 3. 2014

ISBN

0957-0233

Periodical

Measurement Science and Technology

Year of study

25

Number

4

State

United Kingdom of Great Britain and Northern Ireland

Pages from

1

Pages to

8

Pages count

8

BibTex

@article{BUT107368,
  author="Petr {Klapetek} and David {Nečas}",
  title="Independent analysis of mechanical data from atomic force microscopy",
  journal="Measurement Science and Technology",
  year="2014",
  volume="25",
  number="4",
  pages="1--8",
  doi="10.1088/0957-0233/25/4/044009",
  issn="0957-0233"
}