Publication result detail

An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

STARKOV, A.; STARKOV, I.

Original Title

An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

English Title

An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

We have proposed a new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip. The initial statement of the model has only a numerical solution. To find an analytical solution of the problem, some assumptions are introduced: the domain wall thickness can be considered to be much smaller than the domain size, and we use a high ferroelectric dielectric permittivity. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. We have calculated and then analyzed the tip capacitance as a function of the distance from the ferroelectric interface. Additionally, different forms of the SPM tip are considered. It is demonstrated that in the presence of charges at the domain, the results differ from those obtained with the widely used dielectric model by 30%.

English abstract

We have proposed a new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip. The initial statement of the model has only a numerical solution. To find an analytical solution of the problem, some assumptions are introduced: the domain wall thickness can be considered to be much smaller than the domain size, and we use a high ferroelectric dielectric permittivity. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. We have calculated and then analyzed the tip capacitance as a function of the distance from the ferroelectric interface. Additionally, different forms of the SPM tip are considered. It is demonstrated that in the presence of charges at the domain, the results differ from those obtained with the widely used dielectric model by 30%.

Keywords

Capacitance Dielectrics Electric fields Electric potential Media Microscopy Substrates

Key words in English

Capacitance Dielectrics Electric fields Electric potential Media Microscopy Substrates

Authors

STARKOV, A.; STARKOV, I.

Released

11.12.2013

ISBN

0885-3010

Periodical

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL

Volume

60

Number

12

State

United States of America

Pages from

2465

Pages to

2470

Pages count

6

URL

http://dx.doi.org/10.1109/TUFFC.2013.2846

BibTex

@article{BUT110459,
  author="A.S. {Starkov} and Ivan {Starkov}",
  title="An analytical approach for scanning probe microscope-tip electrostatic field distribution accounting for dead layer and domain wall",
  journal="IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL",
  year="2013",
  volume="60",
  number="12",
  pages="2465--2470",
  doi="10.1109/TUFFC.2013.2846",
  issn="0885-3010",
  url="http://dx.doi.org/10.1109/TUFFC.2013.2846"
}