Přístupnostní navigace
E-application
Search Search Close
Publication detail
HOFMAN, J. SHARP, R.
Original Title
Measurement methods for total ionising dose testing: in-situ versus standard practice
Type
conference paper
Language
English
Original Abstract
The work presented here discusses two test methodologies for total ionising dose radiation testing of electronic components and ways in which common practice can be improved. Emphasis is given to modern, fully automated test solutions, using in-situ measurement methods. Results from pilot, proof-of-concept, experimental in-situ tests are also presented in this paper. These show that the in-situ method offers considerable advantages in terms of data fidelity and a much clearer understanding of the effects of radiation on the devices being tested.
Keywords
automated test equipment, intelligent sensors, in-situ test, total ionising dose test, voltage reference
Authors
HOFMAN, J.; SHARP, R.
RIV year
2012
Released
14. 9. 2012
Publisher
IEEE
Location
Miami, FL, USA
ISBN
978-1-4673-2730-5
Book
Radiation Effects Data Workshop (REDW), 2012 IEEE
Pages from
1
Pages to
4
Pages count
BibTex
@inproceedings{BUT114096, author="Jiří {Hofman} and Richard {Sharp}", title="Measurement methods for total ionising dose testing: in-situ versus standard practice", booktitle="Radiation Effects Data Workshop (REDW), 2012 IEEE", year="2012", pages="1--4", publisher="IEEE", address="Miami, FL, USA", isbn="978-1-4673-2730-5" }