Publication detail

Methods for topography artifacts compensation in scanning thermal microscopy

MARTINEK, J. KLAPETEK, P. CHARVÁTOVÁ CAMPBELL, A.

Original Title

Methods for topography artifacts compensation in scanning thermal microscopy

Type

journal article in Web of Science

Language

English

Original Abstract

Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. Three methods for numerically estimating and compensating for topographic artifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe–sample interaction. A local topography and an estimated probe shape are used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measured data.

Keywords

Scanning thermal microscopy; Artifacts; Neural networks

Authors

MARTINEK, J.; KLAPETEK, P.; CHARVÁTOVÁ CAMPBELL, A.

RIV year

2015

Released

1. 8. 2015

Publisher

Elsevier

ISBN

0304-3991

Periodical

Ultramicroscopy

Year of study

155

Number

1

State

Kingdom of the Netherlands

Pages from

55

Pages to

61

Pages count

7

URL

https://www.sciencedirect.com/science/article/pii/S0304399115000959

Full text in the Digital Library

http://hdl.handle.net/11012/201148

BibTex

@article{BUT114643,
  author="Jan {Martinek} and Petr {Klapetek} and Anna {Charvátová Campbell}",
  title="Methods for topography artifacts compensation in scanning thermal microscopy",
  journal="Ultramicroscopy",
  year="2015",
  volume="155",
  number="1",
  pages="55--61",
  doi="10.1016/j.ultramic.2015.04.011",
  issn="0304-3991",
  url="https://www.sciencedirect.com/science/article/pii/S0304399115000959"
}