Publication detail

Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop

ŠOTNER, R. JEŘÁBEK, J. HERENCSÁR, N. VRBA, K. LAHIRI, A. DOSTÁL, T.

Original Title

Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop

Type

journal article in Web of Science

Language

English

Original Abstract

The paper deals with precise analysis of simple AC variable gain CMOS amplifier. The circuit can be used as a simple voltage follower (6 MOS transistors are required) or amplifier. The main attention of this work is focused on a small-signal model of the proposed block and effects of additional passive network leading to compensation of its instability. The continuous gain adjusting in range from 1.1 to 10 (0.8 – 20 dB and with bandwidth 4.9 - 90 MHz at 5 pF load capacitance) is possible and the proposed amplifier is suitable for implementation in systems, where lower range of gain adjusting and large dynamical range is required. Theoretical analyses are supported by PSpice simulations (TSMC 0.18 um technological models) and experimental measurements with commercially available CMOS transistor fields (ALD1106/7) also confirm the discussed behavior of the amplifier.

Keywords

Active elements, instability compensation, variable gain amplifier, voltage buffer, voltage follower, voltage gain adjusting.

Authors

ŠOTNER, R.; JEŘÁBEK, J.; HERENCSÁR, N.; VRBA, K.; LAHIRI, A.; DOSTÁL, T.

RIV year

2015

Released

6. 7. 2015

Publisher

De Gruyter Open

ISBN

1335-8871

Periodical

Measurement Science Review

Year of study

15

Number

3

State

Slovak Republic

Pages from

139

Pages to

151

Pages count

13

URL

Full text in the Digital Library

BibTex

@article{BUT115199,
  author="Roman {Šotner} and Jan {Jeřábek} and Norbert {Herencsár} and Kamil {Vrba} and Abhirup {Lahiri} and Tomáš {Dostál}",
  title="Study of Small-signal Model of Simple CMOS Amplifier with Instability Compensation of Positive Feedback Loop",
  journal="Measurement Science Review",
  year="2015",
  volume="15",
  number="3",
  pages="139--151",
  doi="10.1515/msr-2015-0021",
  issn="1335-8871",
  url="http://www.degruyter.com/view/j/msr.2015.15.issue-3/msr-2015-0021/msr-2015-0021.xml?format=INT"
}