Publication detail

Current Fluctuations of Reverse-Biased Solar Cells

ŠKVARENINA, Ľ.

Original Title

Current Fluctuations of Reverse-Biased Solar Cells

Type

conference paper

Language

English

Original Abstract

This paper presents mainly noise diagnostics of pn junctions local defects in a single-crystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.

Keywords

Solar Cells; Silicon; Noise Spectroscopy; Diagnostics; Defects; Flicker Noise

Authors

ŠKVARENINA, Ľ.

RIV year

2015

Released

23. 4. 2015

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Location

Brno

ISBN

978-80-214-5148-3

Book

Proceedings of the 21st Conference STUDENT EEICT 201

Edition number

1.

Pages from

546

Pages to

550

Pages count

5

URL

http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf

BibTex

@inproceedings{BUT115271,
  author="Ľubomír {Škvarenina}",
  title="Current Fluctuations of Reverse-Biased Solar Cells",
  booktitle="Proceedings of the 21st Conference STUDENT EEICT 201",
  year="2015",
  number="1.",
  pages="546--550",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  address="Brno",
  isbn="978-80-214-5148-3",
  url="http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf"
}