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TOMÁNEK, P. ŠKARVADA, P. MACKŮ, R. SOBOLA, D. BRÜSTLOVÁ, J. GRMELA, L.
Original Title
Microscale localization and detection of defects in crystalline silicon solar cells
Type
journal article - other
Language
English
Original Abstract
Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.
Keywords
defect, silicon, solar cell, localization, detection
Authors
TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L.
RIV year
2015
Released
17. 8. 2015
Publisher
DGaO
Location
Erlangen, Německo
ISBN
1614-8436
Periodical
DGaO-PROCEEDINGS
Year of study
Number
State
Federal Republic of Germany
Pages from
1
Pages to
2
Pages count
URL
http://www.dgao-proceedings.de
BibTex
@article{BUT116796, author="Pavel {Tománek} and Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Jitka {Brüstlová} and Lubomír {Grmela}", title="Microscale localization and detection of defects in crystalline silicon solar cells", journal="DGaO-PROCEEDINGS", year="2015", volume="2015", number="2015", pages="1--2", issn="1614-8436", url="http://www.dgao-proceedings.de" }