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ŠKVARENINA, Ľ. MACKŮ, R.
Original Title
Noise and optical spectroscopy of single junction silicon solar cell
Type
journal article in Web of Science
Language
English
Original Abstract
Noise spectroscopy as a highly sensitive method for non-destructive diagnostics of semiconductor devices was applied to solar cells based on crystalline silicon with a view to evaluating the quality and reliability of this solar cell type. The experimental approach was used in a reverse-biased condition where the internal structure of solar cells, as well as pn junction itself, was electrically stressed and overloaded by a strong electric field. This gave a rise to a strong generation of a current noise accompanied by local thermal instabilities, especially in the defect sites. It turned out that local temperature changes could be correlated with a flicker noise generation in a wide frequency range. Furthermore, an electrical breakdown in a non-stable form also occurred in some specific local regions what created a microplasma noise with a two-level current fluctuation in form of the Lorentzian-like noise spectrum. The noise research was conducted on both these phenomena in combination with a spectrally-filtered electroluminescence mapping in a visible/near-infrared spectrum range and a dark lock-in infrared thermography in a far-infrared range. Then the physical origin of the light emission from the particular defects was searched by a scanning electron microscope and additionally was performed an experimental elimination of one specific defect by a focused ion beam milling.
Keywords
non-destructive diagnostics, c-Si solar cells, 1/f noise, electroluminescence, lock-in IR thermography
Authors
ŠKVARENINA, Ľ.; MACKŮ, R.
Released
30. 6. 2018
Publisher
Metrology and Measurement Systems
Location
Poland: Gdańsk
ISBN
0860-8229
Periodical
METROL MEAS SYST
Year of study
25
Number
2
State
Republic of Poland
Pages from
303
Pages to
316
Pages count
14
URL
http://journals.pan.pl/Content/104031/PDF/art04.pdf
BibTex
@article{BUT116892, author="Ľubomír {Škvarenina} and Robert {Macků}", title="Noise and optical spectroscopy of single junction silicon solar cell", journal="METROL MEAS SYST", year="2018", volume="25", number="2", pages="303--316", doi="10.24425/119565", issn="0860-8229", url="http://journals.pan.pl/Content/104031/PDF/art04.pdf" }