Publication detail

Estimation of ultrasound attenuation coefficient using log-spectrum domain processing

JIŘÍK, R. TAXT, T. JAN, J.

Original Title

Estimation of ultrasound attenuation coefficient using log-spectrum domain processing

Type

conference paper

Language

English

Original Abstract

Ultrasound attenuation coefficient is an important diagnostic parameter in medical ultrasonography. Furthermore, it is a parameter of a component related to the attenuation process of the space-variant point spread function, which can be used to improve the spatial resolution of ultrasound images through deconvolution. In this paper, a recently published approach to the estimation of the ultrasound attenuation coefficient from B-scan radiofrequency data is extended and explained in a detail. First, a parametric image of the mean attenuation coefficients between the probe and a given pixel position is computed by applying linear regression to log-spectra of short segments of radiofrequency signals. Three methods of forming the parametric image are presented. As a second step, the local tissue-specific attenuation coefficients are estimated in small regions of the obtained parametric image. The method has been tested on synthetic radiofrequency data and on radiofrequency data recorded from a tissue-mimicking phantom. A fairly good correlation with the known reference values was achieved.

Keywords

Medical ultrasonic imaging, parametric imaging, ultrasound attenuation, attenuation maps

Authors

JIŘÍK, R.; TAXT, T.; JAN, J.

RIV year

2004

Released

1. 1. 2004

Publisher

IEEE inc.

Location

USA

ISBN

0-7803-8440-7

Book

Proceedings of the 26th Annual Int. Conf. of the IEEE EMBS

Pages from

1411

Pages to

1414

Pages count

4

BibTex

@inproceedings{BUT11706,
  author="Radovan {Jiřík} and Torfinn {Taxt} and Jiří {Jan}",
  title="Estimation of ultrasound attenuation coefficient using log-spectrum domain processing",
  booktitle="Proceedings of the 26th Annual Int. Conf. of the IEEE EMBS",
  year="2004",
  pages="4",
  publisher="IEEE inc.",
  address="USA",
  isbn="0-7803-8440-7"
}