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CHOBOLA, Z. LUŇÁK, M. VANĚK, J. DOLENSKÝ, J. BAŘINKA, R.
Original Title
Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency
Type
conference paper
Language
English
Original Abstract
This paper deals with comparisons of noise spectroscopy and I-V characteristic of silicon concentrator photovoltaic (CPV) cell with very high efficiency. Efficiency reaches to 38%. We studied two groups with different technologies (A and B). Each group had 6 samples. The samples were quality screened using noise analysis. From the measurement results it follows that the noise spectral density related to defects is of 1/f or generationrecombination types. G-r noise and burst noise is not fundamental noise and therefore can by use as quality indicator. For the determination of a possible noise source there was used the microplasma detection method and ESEM displaying.
Keywords
Concentrators, Crystalline, Epitaxy, Solar cell, ESEM displaying
Authors
CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; DOLENSKÝ, J.; BAŘINKA, R.
RIV year
2015
Released
18. 9. 2015
Publisher
WIP
Location
Hamburg
ISBN
3-936338-39-6
Book
Proceedings of 31st European PV Solar Energy Conference and Exhibition
2196-0992
Periodical
EU PVSEC 2014 Proceedings DVD
Year of study
1
Number
20515
State
Federal Republic of Germany
Pages from
2449
Pages to
2452
Pages count
4
BibTex
@inproceedings{BUT118906, author="Zdeněk {Chobola} and Miroslav {Luňák} and Jiří {Vaněk} and Jan {Dolenský} and Radim {Bařinka}", title="Low-Frequency Noise Quality Testing of Silicon Concentrator Photovoltaic Cell With Very High Efficiency ", booktitle="Proceedings of 31st European PV Solar Energy Conference and Exhibition", year="2015", journal="EU PVSEC 2014 Proceedings DVD", volume="1", number="20515", pages="2449--2452", publisher="WIP", address="Hamburg", doi="10.4229/EUPVSEC20152015-5BV.4.25", isbn="3-936338-39-6", issn="2196-0992" }