Publication detail

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Veronika Novotná

Original Title

Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Type

conference paper

Language

English

Original Abstract

This paper deals with usage of a low voltage STEM for biological purposes. The investigation of electron beam induced mass loss of ultrathin sections of three embedding media is presented. The mass loss of the sample caused by the electron bombardment is not examined in detail in the literature but it seems to be an important fact in investigation of biological samples by low voltage STEM. The samples of different thickness were investigated using different microscope settings (acceleration voltage, total dose, probe current, cleaning of the sample surface) and STEM imaging modes (bright-field, dark-field).

Keywords

STEM, Mass loss, Embedding media, Total irradiated dose

Authors

Veronika Novotná

RIV year

2014

Released

5. 5. 2014

Publisher

LITERA

Location

Brno

ISBN

978-80-214-4923-7

Book

Student EEICT - Proceedings of the 20th conference

Edition number

1

Pages from

139

Pages to

141

Pages count

288

BibTex

@inproceedings{BUT121043,
  author="Veronika {Novotná}",
  title="Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  booktitle="Student EEICT - Proceedings of the 20th conference",
  year="2014",
  number="1",
  pages="139--141",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4923-7"
}