Publication detail

Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM

Veronika Novotná, Vladislav Krzyžánek, Kamila Dobranská, Jana Nebesářová

Original Title

Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM

Type

abstract

Language

English

Original Abstract

This abstract for Microscopy and Microanalysis 2014 conference in Hartford,USA speaks about influence of the primary electron beam to the sensitive samples in the low voltage STEM.

Keywords

STEM, Embedding media, Epon, Spurr, LR White, Mass loss

Authors

Veronika Novotná, Vladislav Krzyžánek, Kamila Dobranská, Jana Nebesářová

Released

4. 8. 2014

Location

Hartford, USA

Pages count

2

BibTex

@misc{BUT121044,
  author="Veronika {Novotná}",
  title="Investigation of Electron Beam Induced Mass Loss of Embedding media in the Low Voltage STEM",
  year="2014",
  pages="2",
  address="Hartford, USA",
  note="abstract"
}