Publication detail

The Mechanical Strength of Solder Joints on PCB with OSP surface protection

NOVOTNÝ, V. ADÁMEK, M. SKÁCEL, J. ŠANDERA, J. VALA, R.

Original Title

The Mechanical Strength of Solder Joints on PCB with OSP surface protection

Type

conference paper

Language

English

Original Abstract

This paper describes some results obtained by the study of influences of different factors which define reliability of solder joints. Generally, these factors include substrate, type of solder paste, soldered components, surface protection of soldering areas and methods of reflowing. In our case, these influences are evaluated with focus on PCB with OSP surface protection under condition of thermal cycling and shear testing. The results from experimental measuring are complemented with computer analysis of models of solder joints and components in ANSYS. Finally, there is evaluation of practical results in conjunction with simulations.

Keywords

Soldering, Lead, Testing, Reliability, Resistors, Finite element analysis, Temperature measurement

Authors

NOVOTNÝ, V.; ADÁMEK, M.; SKÁCEL, J.; ŠANDERA, J.; VALA, R.

Released

18. 5. 2016

Publisher

IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA

Location

Pilsen, Czech republic

ISBN

978-1-5090-1389-0

Book

Proceedings of the International Spring Seminar on Electronics Technology, 39th International Spring Seminar on Electronics Technology, ISSE 2016

Edition

Volume 2016-September

Edition number

1

ISBN

2161-2536

Periodical

International Spring Seminar on Electronics Technology ISSE

Year of study

1

Number

1

State

United States of America

Pages from

249

Pages to

253

Pages count

5

URL

http://ieeexplore.ieee.org.ezproxy.lib.vutbr.cz/document/7563199/authors

BibTex

@inproceedings{BUT125190,
  author="Václav {Novotný} and Martin {Adámek} and Josef {Skácel} and Josef {Šandera} and Radek {Vala}",
  title="The Mechanical Strength of Solder Joints on PCB with OSP surface protection",
  booktitle="Proceedings of the International Spring Seminar on Electronics Technology, 39th International Spring Seminar on Electronics Technology, ISSE 2016",
  year="2016",
  series="Volume 2016-September",
  journal="International Spring Seminar on Electronics Technology ISSE",
  volume="1",
  number="1",
  pages="249--253",
  publisher="IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA",
  address="Pilsen, Czech republic",
  doi="10.1109/ISSE.2016.7563199",
  isbn="978-1-5090-1389-0",
  issn="2161-2536",
  url="http://ieeexplore.ieee.org.ezproxy.lib.vutbr.cz/document/7563199/authors"
}