Publication detail

Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

AHMED, M.

Original Title

Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

Type

conference paper

Language

English

Original Abstract

Photo-induced charge (PIQ) measurements are employed for the characterization of evaporated ZnS:Mn alternating-current thin-film-electroluminescent (ACTFEL) devices. By changing the polarity of the applied voltage pulse, either electron or hole transport may be studied. PIQ trends indicate that electron transport is significantly more efficient than hole transport due to hole trapping in the ZnS. Hole trapping is characterized by a drift length of (180 plus minus 70) nm, a hole lifetime of 2 ps, and a capture cross-section of 7.10 power minus13 cm2.

Keywords

Photo-induced charge, hole drift length, measurement, evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

Authors

AHMED, M.

RIV year

2004

Released

3. 11. 2004

Publisher

Fakulta elektrotechnická, Zapadočeská univezita v Plzni

Location

Plzeň

ISBN

80-7043-300-0

Book

Elektortechnika a informatika 2004

Pages from

63

Pages to

66

Pages count

4

BibTex

@inproceedings{BUT12613,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices",
  booktitle="Elektortechnika a informatika 2004",
  year="2004",
  pages="63--66",
  publisher="Fakulta elektrotechnická, Zapadočeská univezita v Plzni",
  address="Plzeň",
  isbn="80-7043-300-0"
}