Publication detail

Numerical Simulation of the Nail Test

VYROUBAL, P. KAZDA, T. BAYER, R.

Original Title

Numerical Simulation of the Nail Test

Type

conference paper

Language

English

Original Abstract

Internal short-circuit is the most dangerous abusive condition for Li-ion batteries and has been the root cause for several catastrophic accidents involving Li-ion batteries in recent years. Large-format Li-ion batteries are particularly vulnerable to internal short-circuits because of high energy content. Nail penetration test is commonly used to study the internal shortcircuits, but the test results usually have poor reproducibility and offer limited insight. This paper deals with a possibility of numerical simulation of internal short circuit test using FEM.

Keywords

Lithium Ion Battery, FEM, nail test, short circuit

Authors

VYROUBAL, P.; KAZDA, T.; BAYER, R.

Released

29. 8. 2016

Publisher

Brno University of Technology

Location

Brno

ISBN

978-80-214-5384-5

Book

Advanced Batteries Accumulators and Fuel Cells – 17th ABAF

Pages from

169

Pages to

170

Pages count

2

BibTex

@inproceedings{BUT128352,
  author="Petr {Vyroubal} and Tomáš {Kazda} and Robert {Bayer}",
  title="Numerical Simulation of the Nail Test",
  booktitle="Advanced Batteries Accumulators and Fuel Cells – 17th ABAF",
  year="2016",
  pages="169--170",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-5384-5"
}