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ŠKARVADA, P. ŠKVARENINA, Ľ. TOMÁNEK, P. SOBOLA, D. MACKŮ, R. BRÜSTLOVÁ, J. GRMELA, L. SMITH, S.
Original Title
Multiscale experimental characterization of solar cell defects
Type
conference paper
Language
English
Original Abstract
The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.
Keywords
solar cell, defect, noise, multiscale, detection, localization
Authors
ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S.
Released
24. 12. 2016
Publisher
SPIE
Location
Bellingham, USA
ISBN
9781510607330
Book
20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics
Edition
SPIE Proceedings
Edition number
10142
0277-786X
Periodical
Proceedings of SPIE
Year of study
Number
State
United States of America
Pages from
101420U1
Pages to
101420U7
Pages count
7