Publication detail

Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors

SCHAUER, P.

Original Title

Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors

Type

conference paper

Language

English

Original Abstract

Noise trap spectroscopy, being a method of material characterization, is introduced in this paper. This method of characterization makes it possible to localize the traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light.

Keywords

Noise Traps Spectroscopy

Authors

SCHAUER, P.

Released

1. 12. 2004

Publisher

Brno University of Technology

Location

Brno

ISBN

80-7204-371-4

Book

Workshop NDT 2004, Non-Destructive Testing

Pages from

189

Pages to

191

Pages count

3

BibTex

@inproceedings{BUT13102,
  author="Pavel {Schauer}",
  title="Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors",
  booktitle="Workshop NDT 2004, Non-Destructive Testing",
  year="2004",
  pages="3",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-7204-371-4"
}