Publication detail

SILICON SOLAR CELL PARAMETERS CHANGE AFTER FOCUSED ION BEAM MILLING

GAJDOŠ, A.

Original Title

SILICON SOLAR CELL PARAMETERS CHANGE AFTER FOCUSED ION BEAM MILLING

Type

conference paper

Language

English

Original Abstract

Silicon is still one of the most used materials for fabrication of solar cells. Some imper- fections and defects may appear during production process. These local imperfections could be eliminated by focused ion beam (FIB). Nevertheless, FIB milling process modifies the crystal structure of the material by ions implantation. Samples under investigation are monocrystalline sili- con solar cells. The impact of FIB milling is shown and discussed through current-voltage measu- rement before and after milling process.

Keywords

Silicon, solar cell, focused ion beam, I-V curve, SEM

Authors

GAJDOŠ, A.

Released

27. 4. 2017

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních

Location

Brno

ISBN

978-80-214-5496-5

Book

Proceedings of the 23 rd Conference STUDENT EEICT 2017

Edition number

první

Pages from

665

Pages to

669

Pages count

5

URL

http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf

BibTex

@inproceedings{BUT136041,
  author="Adam {Gajdoš}",
  title="SILICON SOLAR CELL PARAMETERS CHANGE AFTER
FOCUSED ION BEAM MILLING",
  booktitle="Proceedings of the 23 rd Conference STUDENT EEICT 2017",
  year="2017",
  number="první",
  pages="665--669",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
  address="Brno",
  isbn="978-80-214-5496-5",
  url="http://eeict.feec.vutbr.cz/2017/sbornik/EEICT_2017-sbornik-komplet-2.pdf"
}