Publication detail

Beam damage of embedding media sections and their investigations by SEM.

Krzyžánek, Novotná, Hrubanová, Nebesářová

Original Title

Beam damage of embedding media sections and their investigations by SEM.

Type

conference paper

Language

English

Original Abstract

A scanning transmission electron microscope (STEM) is useful device combining features of scanning and transmission electron microscopes. The sample in form of the ultrathin section is scanned by the electron probe and the transmitted electrons are detected. Except the dedicated STEMs this mode can exist as options in both TEM and SEM. The STEM based on the SEM equipped by a transmission detector was used for presented experiments. Nowadays, such low voltage STEM is more often used, and in many cases replaces the typical TEM. Here, we report investigations of embedding media that are typically used for TEM preparation of biological samples. The STEM detector in SEM may be able to detect both bright-field and dark-fields images. It uses much lower acceleration voltages (30 kV and below) than conventional TEM or STEM. However, materials like biological samples, polymers including embedding media are electron beam sensitive. Two the most important beam damages are the mass loss and the contamination. Both types of damages depend on the used electron energy and the electron dose applied to the sample. The mass loss depends on the sample composition, and the contamination results from the poor vacuum in the specimen chamber of the SEM, cleanness of the sample surface, etc.

Keywords

ADF imaging; beam damage; mass determination

Authors

Krzyžánek, Novotná, Hrubanová, Nebesářová

Released

7. 9. 2014

Publisher

Czechoslovak Microscopy Society

Location

Praha

ISBN

978-80-260-6720-7

Book

18th International Microscopy Congres. Proceedings

Pages from

120

Pages to

123

Pages count

3

URL

http://www.microscopy.cz/proceedings/all.html

BibTex

@inproceedings{BUT136768,
  author="Veronika {Novotná} and Vladislav {Krzyžánek} and Kamila {Hrubanová}",
  title="Beam damage of embedding media sections and their investigations by SEM.",
  booktitle="18th International Microscopy Congres. Proceedings",
  year="2014",
  pages="120--123",
  publisher="Czechoslovak Microscopy Society",
  address="Praha",
  isbn="978-80-260-6720-7",
  url="http://www.microscopy.cz/proceedings/all.html"
}