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ŢĂLU, Ş. PAPEŽ, N. SOBOLA, D. ACHOUR, A. SOLAYMANI, S.
Original Title
Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters
Type
journal article in Web of Science
Language
English
Original Abstract
The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.
Keywords
Solar cells, topography, microscopy, fractal analysis, atomic force microscopy, surface roughness
Authors
ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S.
Released
3. 7. 2017
Publisher
Springer
ISBN
0957-4522
Periodical
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Year of study
28
Number
15
State
Kingdom of the Netherlands
Pages from
1
Pages to
12
Pages count
URL
https://link.springer.com/article/10.1007/s10854-017-7422-4
BibTex
@article{BUT137752, author="Ştefan {Ţălu} and Nikola {Papež} and Dinara {Sobola} and Amine {Achour} and Shahram {Solaymani}", title="Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters", journal="JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS", year="2017", volume="28", number="15", pages="1--12", doi="10.1007/s10854-017-7422-4", issn="0957-4522", url="https://link.springer.com/article/10.1007/s10854-017-7422-4" }