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VEČEŘA, I. VRBA, R. ŠVÉDA, M.
Original Title
A/D Switched-Current Converter with Built-in Self Testing Features
Type
article in a collection out of WoS and Scopus
Language
English
Original Abstract
Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.
Keywords
DFT, BIST, switched-current mode, A/D converter, fault model
Authors
VEČEŘA, I.; VRBA, R.; ŠVÉDA, M.
RIV year
2003
Released
15. 2. 2003
Publisher
The International Institute of Informatics and Systemics
Location
Orlando
ISBN
980-07-8150-1
Book
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III
Pages from
367
Pages to
370
Pages count
4
BibTex
@inproceedings{BUT13785, author="Ivo {Večeřa} and Radimír {Vrba} and Miroslav {Švéda}", title="A/D Switched-Current Converter with Built-in Self Testing Features", booktitle="Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III", year="2003", pages="367--370", publisher="The International Institute of Informatics and Systemics", address="Orlando", isbn="980-07-8150-1" }