Publication detail
Fractional-Order Oscillator Design Using Unity-Gain Voltage Buffers and OTAs
KARTCI, A. HERENCSÁR, N. KOTON, J. BRANČÍK, L. VRBA, K. TSIRIMOKOU, G. PSYCHALINOS, C.
Original Title
Fractional-Order Oscillator Design Using Unity-Gain Voltage Buffers and OTAs
Type
conference paper
Language
English
Original Abstract
In this study, a new voltage-mode fractional-order oscillator using two unity-gain voltage buffers, two operational transconductance amplifiers, one resistor, and two capacitors is presented. The design procedure of integer-order as well as fractional-order oscillator employing in total 20 MOS transistors is discussed. Effects of fractional-order capacitors on amplitude, phase, condition of oscillation, and frequency of oscillation are shown. Various case examples are given while SPICE simulations using TSMC 0.35 µm level-3 CMOS process parameters with ±1.65 V supply voltages verify their operation and compare with theoretical ones.
Keywords
fractional-order circuit; fractional-order oscillator; flipped voltage follower; FVF; operational transconductance amplifier; OTA; voltage buffer; voltage-mode
Authors
KARTCI, A.; HERENCSÁR, N.; KOTON, J.; BRANČÍK, L.; VRBA, K.; TSIRIMOKOU, G.; PSYCHALINOS, C.
Released
6. 8. 2017
Publisher
IEEE
Location
Boston, USA
ISBN
978-1-5090-6389-5
Book
Proceedings of the 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)
Pages from
555
Pages to
558
Pages count
4
URL
Full text in the Digital Library
BibTex
@inproceedings{BUT138292,
author="Aslihan {Kartci} and Norbert {Herencsár} and Jaroslav {Koton} and Lubomír {Brančík} and Kamil {Vrba} and Georgia {Tsirimokou} and Costas {Psychalinos}",
title="Fractional-Order Oscillator Design Using Unity-Gain Voltage Buffers and OTAs",
booktitle="Proceedings of the 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS)",
year="2017",
pages="555--558",
publisher="IEEE",
address="Boston, USA",
doi="10.1109/MWSCAS.2017.8052983",
isbn="978-1-5090-6389-5",
url="http://ieeexplore.ieee.org/document/8052983/"
}