Publication detail

Voltage Gain-Controlled Third-Generation Current Conveyor and its All-Pass Filter Verification

HERENCSÁR, N. KARTCI, A. KOTON, J. TSIRIMOKOU, G. PSYCHALINOS, C.

Original Title

Voltage Gain-Controlled Third-Generation Current Conveyor and its All-Pass Filter Verification

Type

conference paper

Language

English

Original Abstract

The paper presents a new active building block (ABB) called minus-type voltage gain-controlled third-generation current conveyor (VGC-CCIII) in which the voltage gain between Y to X terminal can be controlled. The usefulness of the tunable feature in the presented ABB is demonstrated in current-mode {0.3rd; 0.5th; 0.7th; 1st}-order all-pass filter (APF) employing single VGC-CCIII, one capacitor, and one resistor. The theoretical results of the integer- and fractional-order APF are verified by SPICE simulations based on readily available IC OPA860 macromodel, which can also be used in experiments.

Keywords

all-pass filter; current-mode; fractional-order filter; voltage gain-controlled third-generation current conveyor

Authors

HERENCSÁR, N.; KARTCI, A.; KOTON, J.; TSIRIMOKOU, G.; PSYCHALINOS, C.

Released

4. 9. 2017

Publisher

IEEE

Location

Catania, Italy

ISBN

978-1-5386-3974-0

Book

Proceedings of the 2017 23 European Conference on Circuit Theory and Design (ECCTD 2017)

Pages from

1

Pages to

4

Pages count

4

URL

http://ieeexplore.ieee.org/document/8093273/

Full text in the Digital Library

http://hdl.handle.net/11012/70220

BibTex

@inproceedings{BUT139038,
  author="Norbert {Herencsár} and Aslihan {Kartci} and Jaroslav {Koton} and Georgia {Tsirimokou} and Costas {Psychalinos}",
  title="Voltage Gain-Controlled Third-Generation Current Conveyor and its All-Pass Filter Verification",
  booktitle="Proceedings of the 2017 23 European Conference on Circuit Theory and Design (ECCTD 2017)",
  year="2017",
  pages="1--4",
  publisher="IEEE",
  address="Catania, Italy",
  doi="10.1109/ECCTD.2017.8093273",
  isbn="978-1-5386-3974-0",
  url="http://ieeexplore.ieee.org/document/8093273/"
}