Publication detail

Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems

KOTÁSEK, Z. MIKA, D. STRNADEL, J.

Original Title

Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In the paper, two different methodologies for the identification of registers to be included into the partial scan chain and principles of their implementation are described briefly. One of them is based on the utilisation of genetic algorithms, the other one on the identification of feedback loops. An attention is paid to the computation of time and space complexities of the developed algorithms. The possibility of the complete state-space exploration (all possible scan chain configurations) is also discussed. It is derived that algorithms based on genetic algorithms allow to gain sub-optimal solutions while fulfilling user requirements. The combination of both methodologies is investigated and the complexities analysed. Experimental results are described.

Keywords

Register Transfer Level, Feedback Loop, Genetic Algorithm

Authors

KOTÁSEK, Z.; MIKA, D.; STRNADEL, J.

RIV year

2003

Released

14. 4. 2003

Publisher

Publishing House of Poznan University of Technology

Location

Poznaň

ISBN

83-7143-557-6

Book

Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems

Pages from

233

Pages to

238

Pages count

6

BibTex

@inproceedings{BUT13958,
  author="Zdeněk {Kotásek} and Daniel {Mika} and Josef {Strnadel}",
  title="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  booktitle="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  year="2003",
  pages="233--238",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznaň",
  isbn="83-7143-557-6"
}