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Publication detail
KOTÁSEK, Z. MIKA, D. STRNADEL, J.
Original Title
Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Type
article in a collection out of WoS and Scopus
Language
English
Original Abstract
In the paper, two different methodologies for the identification of registers to be included into the partial scan chain and principles of their implementation are described briefly. One of them is based on the utilisation of genetic algorithms, the other one on the identification of feedback loops. An attention is paid to the computation of time and space complexities of the developed algorithms. The possibility of the complete state-space exploration (all possible scan chain configurations) is also discussed. It is derived that algorithms based on genetic algorithms allow to gain sub-optimal solutions while fulfilling user requirements. The combination of both methodologies is investigated and the complexities analysed. Experimental results are described.
Keywords
Register Transfer Level, Feedback Loop, Genetic Algorithm
Authors
KOTÁSEK, Z.; MIKA, D.; STRNADEL, J.
RIV year
2003
Released
14. 4. 2003
Publisher
Publishing House of Poznan University of Technology
Location
Poznaň
ISBN
83-7143-557-6
Book
Pages from
233
Pages to
238
Pages count
6
BibTex
@inproceedings{BUT13958, author="Zdeněk {Kotásek} and Daniel {Mika} and Josef {Strnadel}", title="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems", booktitle="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems", year="2003", pages="233--238", publisher="Publishing House of Poznan University of Technology", address="Poznaň", isbn="83-7143-557-6" }