Publication detail

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

STRNADEL, J.

Original Title

Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The existence of loops in a circuit structure causes problems in both test generation and application. When nested loops occur in the circuit, it is necessary to break the most nested one(s) to improve circuit testability significantly, with minimal design cost. The paper deals with a new method of detecting and breaking loops in the register-transfer level (RTL) digital circuit structure.

Keywords

Feedback vertex set problem, feedback arc set problem, loop coverage, loop dependencies, algebraic analysis, linear algebra, matrix operations

Authors

STRNADEL, J.

RIV year

2003

Released

14. 4. 2003

Publisher

Publishing House of Poznan University of Technology

Location

Poznan

ISBN

83-7143-557-6

Book

Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems

Pages from

303

Pages to

304

Pages count

2

URL

https://www.fit.vut.cz/research/publication/7160/

BibTex

@inproceedings{BUT13959,
  author="Josef {Strnadel}",
  title="Algebraic Analysis of Feedback Loop Dependencies in Order of Improving RTL Digital Circuit Testability",
  booktitle="Proceedings of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  year="2003",
  pages="303--304",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznan",
  isbn="83-7143-557-6",
  url="https://www.fit.vut.cz/research/publication/7160/"
}

Documents

2003-ddecs.pdf