Publication detail

The Test Controller Design Based on I-Path Concept

MIKA, D.

Original Title

The Test Controller Design Based on I-Path Concept

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In the paper the process of the test controller design and synthesis on register transfer level is described. The principle of circuit element access is discussed during the test plan scheduling. The formal tool - a mathematical logic and a set theory - is used as suitable tool for test controller design process. The problem of I-path is explained and a simple example of I-path is also demonstrated.

Keywords

Register Transfer Level, I-path, I-mode, Circuit Under Test

Authors

MIKA, D.

RIV year

2004

Released

24. 4. 2003

Publisher

Faculty of Electrical Engineering and Communication BUT

Location

Brno

ISBN

80-214-2379-X

Book

Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3

Pages from

624

Pages to

628

Pages count

5

BibTex

@inproceedings{BUT13963,
  author="Daniel {Mika}",
  title="The Test Controller Design Based on I-Path Concept",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  pages="624--628",
  publisher="Faculty of Electrical Engineering and Communication BUT",
  address="Brno",
  isbn="80-214-2379-X"
}