Publication detail

Scan Layout Encoding by Means of a Binary String

STRNADEL, J.

Original Title

Scan Layout Encoding by Means of a Binary String

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper deals with a problem of modelling a scan layout by means of a binary string. Using the proposed binary encoding, it is possible to identify concrete scan layout within a digital circuit. Encoded binary string can be seen as a unique identification of a set of registers that will be modified into scan registers and included into scan chains, parallel scan chains and (optionally) the order of scan registers within each scan chain. It can be also seen as a prescription how to modify digital circuit to include certain scan layout into original circuit structure

Keywords

design for testability, scan layout, state-space analysis, set partition, BELL number, LAH number, STIRLING number

Authors

STRNADEL, J.

RIV year

2003

Released

30. 4. 2003

Location

Ostrava

ISBN

80-85988-86-0

Book

Proceedings of 37th International Conference on Modelling and Simulation of Systems

Pages from

115

Pages to

122

Pages count

8

URL

https://www.fit.vut.cz/research/publication/7179/

BibTex

@inproceedings{BUT13974,
  author="Josef {Strnadel}",
  title="Scan Layout Encoding by Means of a Binary String",
  booktitle="Proceedings of 37th International Conference on Modelling and Simulation of Systems",
  year="2003",
  pages="115--122",
  address="Ostrava",
  isbn="80-85988-86-0",
  url="https://www.fit.vut.cz/research/publication/7179/"
}