Publication detail

Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers

SEKANINA, L. RŮŽIČKA, R.

Original Title

Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved salt and pepper noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.

Keywords

digital circuit, evolvable hardware, testability, image operator

Authors

SEKANINA, L.; RŮŽIČKA, R.

RIV year

2003

Released

7. 5. 2003

Publisher

IEEE Computer Society Press

Location

Los Alamitos

ISBN

0-7695-1977-6

Book

The 2003 NASA/DoD Conference on Evolvable Hardware

Pages from

135

Pages to

144

Pages count

10

URL

https://www.fit.vut.cz/research/publication/7186/

BibTex

@inproceedings{BUT13980,
  author="Lukáš {Sekanina} and Richard {Růžička}",
  title="Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers",
  booktitle="The 2003 NASA/DoD Conference on Evolvable Hardware",
  year="2003",
  pages="135--144",
  publisher="IEEE Computer Society Press",
  address="Los Alamitos",
  isbn="0-7695-1977-6",
  url="https://www.fit.vut.cz/research/publication/7186/"
}