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POSPÍŠIL, M. MARŠÁLEK, R. GÖTTHANS, T.
Original Title
Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating
Type
conference paper
Language
English
Original Abstract
The wireless devices classification based on the transmitter imperfections is one of the promising ways to provide additional security to future wireless communication networks. Although several aspects, both theoretical and practical, have been studied recently, there are no studies investigating the degradation of such authentication due to the environmental changes, such as the device temperature. We present the initial results of measurements of Fclassification method based on the Gaussian mixture model classifier under the influence of temperature variations. With the use of the widely used USRP devices, we also try to estimate which of the RF impairments is sensitive to such changes.
Keywords
RF imperfections; physical layer security; IQ imbalances; USRP
Authors
POSPÍŠIL, M.; MARŠÁLEK, R.; GÖTTHANS, T.
Released
15. 1. 2017
ISBN
978-1-5090-3446-8
Book
Proceedings of IEEE Radio and Wireless Symposium (RWS), 2017
Pages from
169
Pages to
172
Pages count
4
BibTex
@inproceedings{BUT141203, author="Martin {Pospíšil} and Roman {Maršálek} and Tomáš {Götthans}", title="Wireless device classification through transmitter imperfections — Evaluation of performance degradation due to the chip heating", booktitle="Proceedings of IEEE Radio and Wireless Symposium (RWS), 2017", year="2017", pages="169--172", doi="10.1109/RWS.2017.7885978", isbn="978-1-5090-3446-8" }