Publication detail

Low frequecy in submicron MOSFET

Martin BLÁHA

Original Title

Low frequecy in submicron MOSFET

Type

conference paper

Language

English

Original Abstract

This work discusses about Low-Frequenci Noise in the Metal-Oxide Semiconductor (MOS) system. Is describe the current-voltage and noise characteristic of an ultrahin oxide capacitor. In the concluding chapter is describe Impact of gate oxide breakdown on the noise of MOSFETs

Keywords

Low-Frequenci ,Noise, MOSFET

Authors

Martin BLÁHA

RIV year

2005

Released

28. 4. 2005

Location

Brno

ISBN

80-214-2889-9

Book

Student EEICT 2005

Pages from

198

Pages to

201

Pages count

4

BibTex

@inproceedings{BUT14369,
  author="Martin {Bláha}",
  title="Low frequecy in submicron MOSFET",
  booktitle="Student EEICT 2005",
  year="2005",
  pages="4",
  address="Brno",
  isbn="80-214-2889-9"
}