Publication detail

On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking

STRNADEL, J.

Original Title

On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking

Type

conference paper

Language

English

Original Abstract

The problem of dependability assessment can be solved analytically just under predefined conditions. If they do not hold, alternative approaches must apply. Widely, they rely on the Monte Carlo simulation, suffering by the high computational complexity. Some rest on further instruments such as probabilistic timed automata that have been shown to be efficient to solve problems in various areas. However, more general as well as precise and faster instruments such as stochastic timed automata (STA) and statistical model checking (SMC) are available for the same purpose the moment. In the paper, basic terms and principles behind the construction of reliability models and dependability assessment on the STA/SMC basis are summarized, followed by a demonstration of their practical applicability in the area of non-repairable systems. Our main goal is to show that, instruments of STA/SMC can facilitate the dependability assessment process even in adverse conditions such as presence of multiple faults of various parameters.

Keywords

fault tolerant system, dependability, assessment, reliability model, simulation, fault, failure, rate, fault tolerant, stochastic timed automaton, statistical model checking, triple modular redundancy, UPPAAL SMC

Authors

STRNADEL, J.

Released

30. 8. 2017

Publisher

IEEE Computer Society

Location

Los Alamitos

ISBN

978-1-5386-2146-2

Book

Proceedings of the 2017 20th Euromicro Conference on Digital System Design

Pages from

352

Pages to

355

Pages count

4

URL

https://www.fit.vut.cz/research/publication/11365/

BibTex

@inproceedings{BUT144417,
  author="Josef {Strnadel}",
  title="On Dependability Assessment of Fault Tolerant Systems by Means of Statistical Model Checking",
  booktitle="Proceedings of the 2017 20th Euromicro Conference on Digital System Design",
  year="2017",
  pages="352--355",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  doi="10.1109/DSD.2017.12",
  isbn="978-1-5386-2146-2",
  url="https://www.fit.vut.cz/research/publication/11365/"
}