Publication detail

Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

HYLSKÝ, J. STRACHALA, D. VYROUBAL, P. ČUDEK, P. VANĚK, J. VANÝSEK, P.

Original Title

Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

Type

journal article in Web of Science

Language

English

Original Abstract

This paper deals with Potential Induced Degradation (PID) of p-type monocrystalline PV modules (Evergreen) from a photovoltaic power plant that has been in operation mode for 7 years. Within the PV module affected by the PID degradation, the effect of the electric field on individual PV cells is studied. The distribution of the electric field was simulated by SolidWorks software. The results show a random distribution of affected PV cells not related to the size and distribution of the electric field intensity. Furthermore, the dependencies of negative voltage potential on the range of PID degradation of individual PV modules located in the negative pole of the PV string is made. From measured current voltage characteristics (measured at STC), it is evident that the value of negative voltage potential is not directly proportional to the PID occurrence. These results are supplemented by electroluminescence images which confirm this finding.

Keywords

Potential induced degradation; Negative voltage potential; Photovoltaic power plant; SolidWorks simulation; Photovoltaic modules

Authors

HYLSKÝ, J.; STRACHALA, D.; VYROUBAL, P.; ČUDEK, P.; VANĚK, J.; VANÝSEK, P.

Released

11. 4. 2018

Publisher

Elsevier

Location

United Kingdom

ISBN

0026-2714

Periodical

Microelectronics Reliability

Number

85

State

United Kingdom of Great Britain and Northern Ireland

Pages from

12

Pages to

18

Pages count

7

URL

BibTex

@article{BUT146960,
  author="Josef {Hylský} and Dávid {Strachala} and Petr {Vyroubal} and Pavel {Čudek} and Jiří {Vaněk} and Petr {Vanýsek}",
  title="Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode",
  journal="Microelectronics Reliability",
  year="2018",
  number="85",
  pages="12--18",
  doi="10.1016/j.microrel.2018.04.003",
  issn="0026-2714",
  url="https://www.sciencedirect.com/science/article/pii/S0026271418301653"
}

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