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SUTORÝ, T.
Original Title
Techniques for Characterization of Integrated Nonlinear Capacitors
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
The paper deals with techniques for capacitance characterization of integrated nonlinear capacitors on a chip. Several methods are compared, main part is about CBCM method (Charge-Based Capacitance Measurements) and it's application to the nonlinear capacitance characterization. Since its invention the CBCM method has been extensively used for on-chip interconnect linear capacitance measurements. However, it can be also used for nonlinear device characterization. Application of CBCM to CMOS gate-capacitance measurements is presented.
English abstract
Key words in English
capacitance characterization, integrated, nonlinear, capacitors, CBCM method, CMOS gate-capacitance
Authors
Released
28.04.2005
Publisher
Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno
Location
Brno
ISBN
-80-214-2889-9
Book
Proceedings of the 11th conference Student EEICT 2005 Volume 2
Pages from
322
Pages count
5
BibTex
@inproceedings{BUT14756, author="Tomáš {Sutorý}", title="Techniques for Characterization of Integrated Nonlinear Capacitors", booktitle="Proceedings of the 11th conference Student EEICT 2005 Volume 2", year="2005", number="první", pages="5", publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno", address="Brno", isbn="-80-214-2889-9" }