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TALU, S. YADAV, R. ŠIK, O. SOBOLA, D. DALLAEV, R. SOLAYMANI, S. MAN, O.
Original Title
How topographical surface parameters are correlated with CdTe monocrystal surface oxidation
Type
journal article in Web of Science
Language
English
Original Abstract
Numerical analysis was applied to three-dimensional (3D) images for a quantitative description of evolution of surface topography of CdTe after oxidation. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Surface texture analysis provides dependence of topography characteristics on oxidation process. The comprehensive description of the surface micromorphology of the CdTe is an important challenge and it is essential for understanding their properties and their potential technological exploitation. The changes in surface topography were evaluated by atomic force microscopy (AFM). This characterization was carried out for the quantitative analysis of specific microstructural characteristics of samples.
Keywords
CdTe monocrystals; Atomic force microscopy; Fractal analysis; Surface oxidation; Surface morphology
Authors
TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O.
Released
31. 5. 2018
Publisher
Elsevier
ISBN
1369-8001
Periodical
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Number
85
State
United Kingdom of Great Britain and Northern Ireland
Pages from
15
Pages to
23
Pages count
9
URL
https://www.sciencedirect.com/science/article/pii/S1369800118303639
BibTex
@article{BUT147823, author="Stefan {Talu} and Ram Pratap {Yadav} and Ondřej {Šik} and Dinara {Sobola} and Rashid {Dallaev} and Shahram {Solaymani} and Ondřej {Man}", title="How topographical surface parameters are correlated with CdTe monocrystal surface oxidation", journal="MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING", year="2018", number="85", pages="15--23", doi="10.1016/j.mssp.2018.05.030", issn="1369-8001", url="https://www.sciencedirect.com/science/article/pii/S1369800118303639" }